NANOscientific - Current Issue

Volume 28 | 06 Jul 2025

NANOscientific Magazine, 2025

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Beyond Potential: A New Frontier In Surface Charge Quantification With FEM/KPFM-Hybrid Approach

Felix Pertl – Inst. of Science and Technology Austria, Austria

Electrical & Electronics Nanotechnology

Redesigning Microwave Impedance Microscopy: Toward Enhanced Nanoscale Dielectric Imaging

Prof. Eric Y. Ma – University of California Berkeley, CA, USA

2D Materials Nanotechnology

Inside The Atomically Thin Frontier: How Spm Is Advancing 2d Tmd Characterization And Device Integration

Dr. Albert Minj – imec, Belgium

Mapping Ions And Polarons With Photoinduced Force Microscopy: Unlocking The Inner Workings Of Organic Mixed Conductors

Prof. Connor Bischak – University of Utah, UT, USA

Informative Vibrations: Quantitative Imaging Of Electroswelling In Organic Mixed Ionic–Electronic Conductors

Prof. Tobias Cramer – University of Bologna, Italy

Electrical & Electronics Nanotechnology

Enabling Nanoelectronics With Advanced Spm Techniques

Prof. Bikas Das – IISER Thiruvananthapuram, India

Revealing Twisted Realities: Mapping MoirÉ Superlattices In Hbn With Afm Phase Imaging

Prof. Stefano Chiodini – Italian Institute of Technology Milan, Italy

Electrical & Electronics Nanotechnology

Unveiling The True Shape Of Conductive Filaments: Adaptive Scalpel Spm Redefines 3d Volumetric Sensing

Md Ashiqur Rahman Laskar – Arizona State University, AZ, USA

Enabling MoirÉ And Atomic Lattice Imaging In 2d Materials With Torsional Force Microscopy

Dr. John Kim & Edward Park – Park Systems Corp., S. Korea

PARK SYSTEMS In Focus

Lyncée Tec Acquisition Brings Holographic Microscopy to Park's Portfolio